THERON, C.; MOKOENA, N.; NDWANDWE, O. Solid-state compound phase formation of TiSi2 thin films under stress. South African Journal of Science, [S. l.], v. 105, n. 11/12, p. 440–444, 2010. Disponível em: https://sajs.co.za/article/view/10227. Acesso em: 24 nov. 2024.